TS-036987 —
A robust solution th
at helps rese
archers incre
ase im
age
and sign
al
accur
acy of
Atomic Force Microscopy.
Atomic Force Microscopy (AFM) was first used to characterize properties of a sample, including physical, material, electromechanical and chemical properties. For most of these multi-physical characterization schemes, an AFM tip scans over a sample while the tip is in contact with the surface. At t…