# of Displayed Technologies: 2 / 2

Applied Category Filter (Click To Remove): Imaging


Multiple image matching for Digital Elevation Model generation from air and spaceborne imagery.
TS-054273 — This invention creates a digital elevation model of the pictured ground from remote sensors by multiple stereo pair photogrammetric processing for increasing image usability, quality of the 3D surface model, and simplifying production process. .tb_button {padding:1px;cursor:pointer;border-right: 1px solid #8b8b8b;border-left: 1px solid #FFF;border-bottom: 1px solid #fff;}.tb_button.hover {borer:2px outset #def; background-color: #f8f8f8 !important;}.ws_toolbar {z-index:100000} .ws_toolbar .ws_tb_btn {cursor:pointer;border:1px solid #555;padding:3px} .tb_highlight{background-color:yellow} .tb_hide {visibility:hidden} .ws_toolbar img {padding:2px;margin:0px}
A Digital Elevation Model (DEM) is a representation of the topographical surface of Earth. A DEM is often used to track climate change and create maps. DEMs are usually generated by active sensors such as LiDAR (Light Detection And Ranging) and passive sensors, such as imaging sensors. LiDAR DEMs …
  • College: Office of Academic Affairs
  • Inventors: Noh, Myoung-Jong
  • Licensing Officer: Zinn, Ryan

Cantilever Design for Measurement of Multi-Physical Properties using Atomic Force Microscopy
TS-036987 — A robust solution that helps researchers increase image and signal accuracy of Atomic Force Microscopy.
Atomic Force Microscopy (AFM) was first used to characterize properties of a sample, including physical, material, electromechanical and chemical properties. For most of these multi-physical characterization schemes, an AFM tip scans over a sample while the tip is in contact with the surface. At t…
  • College: College of Engineering (COE)
  • Inventors: Cho, Han Na "Hanna"; Bergman, Lawrence A; Dharmasena, Sajith; Kim, Seok; Vakakis, Alexander F.
  • Licensing Officer: Zinn, Ryan

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