# of Displayed Technologies: 4 / 4

Applied Category Filter (Click To Remove): Algorithms


Categories

Model-Based, Multi-Criteria Optimization for Sensor Placement and Selection
TS-073138 — Designing online monitoring (OLM) for safety‑critical systems is constrained by scarce early‑stage operational data and by quantitative models that are slow to build, brittle across configurations, and costly to iterate. This creates expensive sensor networks with blind spots, poor diagnosabil…
  • College: College of Engineering (COE)
  • Inventors: Smidts, Carol; Diao, Xiaoxu; Olatubosun, Samuel; Rownak, Md Ragib; Vaddi, Pavan Kumar
  • Licensing Officer: Giles, David

Immersive VR Platform for Human Reliability Assessment for Physical Security
TS-073103 — Physical protection remains a major driver of nuclear plant operations and maintenance costs, yet current security risk models rely on conservative assumptions and sparse empirical data on how defenders and operators actually behave under extreme threat. They rarely capture errors of commission, k…
  • College: College of Engineering (COE)
  • Inventors: Smidts, Carol; Dechasuravanit, Atitarn; Diao, Xiaoxu; Olatubosun, Samuel; Rownak, Md Ragib; Shafieezadeh, Abdollah; Yilmaz, Alper; Zhao, Yunfei
  • Licensing Officer: Giles, David

Propagation-Based Fault Detection and Sensor Optimization for Complex Industrial Systems
TS-072175 — The Need Modern industrial and energy systems are increasingly complex, making timely fault detection and discrimination critical for safety, reliability, and cost control. Existing fault diagnosis methods often struggle with transient states, require extensive historical data, or lack interpretabil…
  • College: College of Engineering (COE)
  • Inventors: Smidts, Carol; Diao, Xiaoxu; Li, Boyuan
  • Licensing Officer: Giles, David

A Model Based Assessment Approach and an Automation Environment for Qualification of Embedded Digital Devices
TS-042856 — A Framework and Automatization process designed to determine the functionality of Embedded Digital Devices.
As our technology becomes increasingly complex, so does the quantity and variation of the Embedded Digital Device [EDD] components that are required within the project. Because not every device is made perfectly to specifications due to a propagation of random error, it is important to have a dive…
  • College: College of Engineering (COE)
  • Inventors: Smidts, Carol; Diao, Xiaoxu; Li, Boyuan
  • Licensing Officer: Giles, David

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