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A vibration free, low temperature sample holder for side-entry transmission electron microscopes
TS-055118 — This invention is a vibration free and temperature adjustable sample holder for transmission electron microscopes, allowing improved imaging of beam-sensitive and temperature dependent specimens in the physical sciences.
Transmission electron microscopy (TEM) is used to capture fine detail of specimens less than 100 nm thick making it ideal for physical, chemical, and biological sciences. To generate an image of a physical science specimen, the sample must be cooled to cryogenic temperatures to halt atomic movemen…
- College: College of Engineering (COE)
- Inventors: Reifsnyder, Alexander; McComb, David
- Licensing Officer: Zinn, Ryan
