Lateral Interband Type-II Engineered (LITE) DetectorThe NeedAvalanche photodiodes (APDs) that target a wavelength of 1550 nm have several applications ranging from optical communications to imaging to single photon detection. There is increasing interest in APDs for longer wavelengths. A distinctive feature of an APD is high sensitivity due to the gain achieved by the impact ionization of carriers. However, this process also introduces excess noise that limits the signal to noise ratio of an APD. Therefore, there is a need for a novel photodetector design that can achieve high gain with low excess noise at long wavelengths. The TechnologyOhio State University researcher Dr. Sanjay Krishna has developed a novel lateral interband Type II engineered (LITE) detector. A LITE is type of photodetector that uses engineered heterostructures to spatially separate electrons and holes into separate layers. The device may have two configurations, a positive intrinsic (PIN) configuration and a bipolar junction transistor (BJT) configuration. The PIN configuration may have a wide bandgap (WBG) layer that transports the holes above or below a narrow bandgap (NBG) absorber layer that absorbs the target radiation and transports the electrons. The BJT configuration may have a WBG layer operating as a BJT above or below an NBG layer. In both configurations, the LITE design uses a Type II staggered offset between the NBG layers and the WBG layers that provides a built-in field for the holes to drift from an absorber region to a transporter region. In addition to the built-in field caused by the heterojunction line up and doping profile, there is an additional applied field typically in the lateral direction. Commercial Applications
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Tech IDT2020-019 CollegeLicensing ManagerRandhawa, Davinder InventorsCategories |