Available Technologies
# of Displayed Technologies: 10 / 12
Applied Category Filter (Click To Remove): Electronics & Photonics
Metal oxide-based resistive type sensor for the detection of carbon monoxide at room temperature
TS-066246 — Our innovative CO sensor utilizes hydrated ruthenium oxide to detect carbon monoxide within a gas mixture with high sensitivity and selectivity at temperatures ranging from 25°C to 300°C.
Reliable and low-cost CO sensors with high sensitivity and selectivity are essential for environmental safety and industrial control, particularly to monitor combustion environments, automotive emissions, and various industrial processes, ensuring compliance with regulations and minimizing health …
- College: College of Arts & Sciences
- Inventors: Dutta, Prabir; Adeyemo, Adedunni
- Licensing Officer: Zinn, Ryan
Monolayer Etching of Wurtzite GaN/AlGaN/AlN Using Cyclic O2 Plasma and Atomic Ga/Al Flux Exposure
TS-063466 —
In the rapidly evolving world of semiconductor technology, there is a growing demand for efficient and precise methods of etching Gallium Nitride (GaN)-based semiconductors. Traditional wet and dry etching processes often damage the GaN, compromising the quality and performance of the final produc…
- College: College of Engineering (COE)
- Inventors: Rajan, Siddharth; Dheenan, Ashok; Rahman, Sheikh Ifatur; Wriedt, Nathan
- Licensing Officer: Zinn, Ryan
Laser Imaging of Gases for Real-Time Determination of Concentration and Location
TS-063051 — A stand-off gas detection system with active, laser-based sensing and imaging capabilities for commercial use
There is a critical need for a reliable, cost-effective, and safe method to detect gas leaks, particularly in gas lines to ensure the safety of service providers and customers. Distribution companies receive over 100,000 calls per year responding to gas odors, indicating potential leaks. The major…
- College: College of Engineering (COE)
- Inventors: Krishna, Sanjay; Ball, Christopher; Fink, Douglas "Rudy"; Fuller, Earl; Mooney, Douglas; Ringel, Brett; Ronningen, TJ
- Licensing Officer: Randhawa, Davinder
GaAsSb-AlGaAsSb Heterostructure Avalanche Photodiode
TS-062893 — A room temperature, ultra-high gain (M=278, λ=1550 nm, V=69.5 V, T=296 K) linear mode avalanche photodiode (APD) on an InP substrate using a GaAs0.5Sb0.5/Al0.85Ga0.15As0.56Sb0.44 separate absorption charge and multiplication (SACM) heterostructure.
An APD is a semiconductor-based analog of the photomultiplier. APDs exploit the impact ionization phenomenon and transform infrared (IR) light (l > 850 nm) into photocurrent. APDs have wide applicability; however, existing APDs have insufficient sensitivity and relatively high excess noise and …
- College: College of Engineering (COE)
- Inventors: Krishna, Sanjay; Jung, Hyemin; Lee, Seunghyun
- Licensing Officer: Randhawa, Davinder
Antimonide based Separate Absorption Charge and Multiplication Avalanche Photodiode
TS-062892 — A room temperature, ultra-high gain (M=278, λ=1550 nm, V=69.5 V, T=296 K) linear mode avalanche photodiode (APD) on an InP substrate using a GaAs0.5Sb0.5/Al0.85Ga0.15As0.56Sb0.44 separate absorption charge and multiplication (SACM) heterostructure.
An APD is a semiconductor-based analog of the photomultiplier. APDs exploit the impact ionization phenomenon and transform infrared (IR) light (l > 850 nm) into photocurrent. APDs have wide applicability; however, existing APDs have insufficient sensitivity and relatively high excess noise an…
- College: College of Engineering (COE)
- Inventors: Krishna, Sanjay; Jung, Hyemin; Lee, Seunghyun
- Licensing Officer: Randhawa, Davinder
A vibration free, low temperature sample holder for side-entry transmission electron microscopes
TS-055118 — This invention is a vibration free and temperature adjustable sample holder for transmission electron microscopes, allowing improved imaging of beam-sensitive and temperature dependent specimens in the physical sciences.
Transmission electron microscopy (TEM) is used to capture fine detail of specimens less than 100 nm thick making it ideal for physical, chemical, and biological sciences. To generate an image of a physical science specimen, the sample must be cooled to cryogenic temperatures to halt atomic movemen…
- College: College of Engineering (COE)
- Inventors: Reifsnyder, Alexander; McComb, David
- Licensing Officer: Zinn, Ryan
A Model Based Assessment Approach and an Automation Environment for Qualification of Embedded Digital Devices
TS-042856 — A Framework and Automatization process designed to determine the functionality of Embedded Digital Devices.
As our technology becomes increasingly complex, so does the quantity and variation of the Embedded Digital Device [EDD] components that are required within the project. Because not every device is made perfectly to specifications due to a propagation of random error, it is important to have a dive…
- College: College of Engineering (COE)
- Inventors: Smidts, Carol; Diao, Xiaoxu; Li, Boyuan
- Licensing Officer: Mess, David
Extreme-Condition Sensors for Use with Electrical Capacitance VolumeTomography & Capacitance Sensing Applications
TS-037841 — A modular and non-invasive ECVT sensor that can be adapted and scaled to vessel demands.
Electrical Capacitance Volume Tomography (ECVT) is a non-invasive image reconstruction that provides volumetric images of a material. An ECVT system is generally comprised of a sensor, data acquisition system, computer system, and software for reconstruction of the 3D image. Capacitance data colle…
- College: College of Engineering (COE)
- Inventors: Marashdeh, Qussai; Alghothani, Yousef; Hudak, Jesse; Legg, Geoffrey; Straiton, Benjamin; Tong, Andrew
- Licensing Officer: Ashouripashaki, Mandana
Cantilever Design for Measurement of Multi-Physical Properties using Atomic Force Microscopy
TS-036987 — A robust solution that helps researchers increase image and signal accuracy of Atomic Force Microscopy.
Atomic Force Microscopy (AFM) was first used to characterize properties of a sample, including physical, material, electromechanical and chemical properties. For most of these multi-physical characterization schemes, an AFM tip scans over a sample while the tip is in contact with the surface. At t…
- College: College of Engineering (COE)
- Inventors: Cho, Han Na "Hanna"; Bergman, Lawrence A; Dharmasena, Sajith; Kim, Seok; Vakakis, Alexander F.
- Licensing Officer: Zinn, Ryan
Device and Technique for Investigation of Phase Transformations in Metals and Alloys Using The Single Sensor Differential Thermal Analyzer (SS-DTA)
TS-015281 —
Dilatometry is a technique currently used for measuring thermal expansion and dilation in solids and liquids. NETZSCH currently offers a variety of dilatometers. However, this equipment can cost thousands of dollars. There is always room for improvement for a faster, simpler, and less expensive te…
- College: College of Engineering (COE)
- Inventors: Alexandrov, Boian; Lippold, John
- Licensing Officer: Zinn, Ryan
