Monolayer Etching of Wurtzite GaN/AlGaN/AlN Using Cyclic O2 Plasma and Atomic Ga/Al Flux ExposureThe NeedIn the rapidly evolving world of semiconductor technology, there is a growing demand for efficient and precise methods of etching Gallium Nitride (GaN)-based semiconductors. Traditional wet and dry etching processes often damage the GaN, compromising the quality and performance of the final product. The TechnologyOur novel method revolutionizes GaN etching by using a Gallium beam flux and oxygen in a vacuum environment. This process leverages the fact that GaN readily oxidizes into Gallium Oxide (GaOx). By exposing Ga2O3 to a Gallium flux, we can etch away the Ga2O3, leaving the undamaged GaN underneath. This process can be repeated multiple times to create intricate 3D structures of GaN. Commercial Applications
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Tech IDT2024-027 CollegeLicensing ManagerZinn, Ryan InventorsCategories |