Available Technologies
# of Displayed Technologies: 4 / 4
Applied Category Filter (Click To Remove): Instrumentation
A vibration free, low temperature sample holder for side-entry transmission electron microscopes
TS-055118 — This invention is a vibration free and temperature adjustable sample holder for transmission electron microscopes, allowing improved imaging of beam-sensitive and temperature dependent specimens in the physical sciences.
Transmission electron microscopy (TEM) is used to capture fine detail of specimens less than 100 nm thick making it ideal for physical, chemical, and biological sciences. To generate an image of a physical science specimen, the sample must be cooled to cryogenic temperatures to halt atomic movemen…
- College: College of Engineering (COE)
- Inventors: Reifsnyder, Alexander; McComb, David
- Licensing Officer: Zinn, Ryan
Cantilever Design for Measurement of Multi-Physical Properties using Atomic Force Microscopy
TS-036987 — A robust solution that helps researchers increase image and signal accuracy of Atomic Force Microscopy.
Atomic Force Microscopy (AFM) was first used to characterize properties of a sample, including physical, material, electromechanical and chemical properties. For most of these multi-physical characterization schemes, an AFM tip scans over a sample while the tip is in contact with the surface. At t…
- College: College of Engineering (COE)
- Inventors: Cho, Han Na "Hanna"; Bergman, Lawrence A; Dharmasena, Sajith; Kim, Seok; Vakakis, Alexander F.
- Licensing Officer: Zinn, Ryan
Device and Technique for Investigation of Phase Transformations in Metals and Alloys Using The Single Sensor Differential Thermal Analyzer (SS-DTA)
TS-015281 —
Dilatometry is a technique currently used for measuring thermal expansion and dilation in solids and liquids. NETZSCH currently offers a variety of dilatometers. However, this equipment can cost thousands of dollars. There is always room for improvement for a faster, simpler, and less expensive te…
- College: College of Engineering (COE)
- Inventors: Alexandrov, Boian; Lippold, John
- Licensing Officer: Zinn, Ryan
An Ultra Precision Six-Axis Visual Servo Control System
TS-014929 — A real-time visual measurement of six-degree-of-freedom motion with nanometer precision.
Conventional microscopic visual feedback systems have limited out-of-plane measurement resolution in the micrometer range, and conventional interferometry systems are inherently not real-time sensors. When dealing with dimensions of sub-micrometer range, small pre-calibration errors, e.g. non-orth…
- College: College of Engineering (COE)
- Inventors: Menq, Chia-Hsiang; Kim, Jung
- Licensing Officer: Zinn, Ryan
