Frame-Resolved Ultrasonic Imaging for Weld and Defect Inspection
TS-076522 —
Manufacturers across aerospace, energy, transportation, and advanced manufacturing sectors require reliable methods to inspect critical components without destructive testing. Conventional ultrasonic inspections often provide only bulk through-thickness information, making it difficult to isolate …
- College: College of Engineering (COE)
- Inventors: Bourgeois, Desmond; McGinnis, Sean
- Licensing Officer: Ashouripashaki, Mandana
Modified Impact Welding: Gap-Free Impulse Welding for Ultra‑Thin Metal Stacks
TS-073603 —
Manufacturers increasingly need to join stacks of very thin metallic foils and mixed‑thickness layers for applications such as electrification, electronics, and advanced manufacturing. Existing solid‑state joining methods—most notably impact welding and ultrasonic welding—struggle with the…
- College: College of Engineering (COE)
- Inventors: Vivek, Anupam; Daehn, Glenn
- Licensing Officer: Ashouripashaki, Mandana
Low-Power Cold Weld Joining for In-Space Manufacturing
TS-070382 — The Need
Current methods for joining metal components in space environments are often complex, energy-intensive, and can compromise the integrity of the materials due to heat-affected zones. There is a need for a reliable, low-power, and safe solution that can create strong metal bonds without causi…
- College: College of Engineering (COE)
- Inventors: Lui, Edward; Daehn, Glenn; Horack, John
- Licensing Officer: Ashouripashaki, Mandana
Computational Design of Experiment Framework for Processing of Metal Alloys
TS-067792 — A software tool for optimizing the manufacturing process for metal alloys.
Metallic alloys are composed of a homogeneous mixture of two or more metals or of metals and nonmetal or metalloid elements to provide specific characteristics or structural properties. Alloys are used in many applications, such as aircraft, offshore drilling, automobiles, and others.
Obtaining t…
- College: College of Engineering (COE)
- Inventors: Alexandrov, Boian; Forquer, Matthew; Jang, Eun; Luo, Yuxiang; Stewart, Jeffrey
- Licensing Officer: Ashouripashaki, Mandana
