Use of electromagnetic signature to determine the type of integrated circuit
Currently, the main method used to detect counterfeit integrated circuits (IC's) is a very simplistic approach based on visual inspection. Unfortunately, many sophisticated counterfeit IC's are indistinguishable from authentic since visually they look almost exactly the same.
Dr. Robert Lee, along with a team of researchers at Ohio State have proposed an innovation for validating the source and characteristics of integrated circuits (ICs). To achieve this, an IC is placed within an enclosed metallic cavity resonator. Electromagnetic energy over a broad frequency band is applied to the cavity. The resultant energy interacts with the IC and the cavity and a portion exits the cavity. The energy is then measured with an instrument such as a network analyzer or spectrum analyzer over the broad frequency band, and the resulting electrical signature reflects the characteristics of the IC, such as its components, connections, and layout.. The invention can then compare the signature of a IC with the signatures of reference ICs from different models or manufactuers. If the signatures differ by more than a threshold amount, the technology can determine that the chip is anomalous, meaning it may be counterfeit or defective.
Dr. Robert Lee is a Professor at Ohio State's Electrical and Computer Engineering Department. Dr. Lee’s research focus has been on the development of computational techniques and its application to the design and analysis of electromagnetic devices and systems.