High-Quality Thick β-Ga₂O₃ Epitaxy for Ultra-High-Voltage Power DevicesThe NeedNext-generation power electronics demand materials that can support ultra-high breakdown voltages, low leakage currents, and scalable manufacturing. While β-Ga₂O₃ is highly attractive for these applications, device performance has been limited by the lack of high-quality, thick drift layers with smooth surfaces and controlled doping. Existing growth approaches often introduce cracking, surface defects, or require costly post-growth polishing, constraining yield, device reliability, and commercial viability relative to incumbent GaN and SiC technologies. The TechnologyOSU engineers have developed a novel epitaxial growth approach for producing thick, high-quality β-Ga₂O₃ films on (011)-oriented native substrates using a scalable MOCVD platform. The method enables rapid growth of smooth, crack-free films with excellent crystalline quality and controlled electrical properties, eliminating the need for post-growth surface treatments. The resulting material is well-suited for vertical device architectures and supports the fabrication of next-generation β-Ga₂O₃ power devices with substantially improved performance margins. Commercial Applications
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Tech IDT2025-354 CollegeLicensing ManagerRandhawa, Davinder InventorsCategoriesExternal Links |