Integrated System Failure Analysis with Chemical Techniques (IS-FACT)
TS-076995 —
Manufacturers of advanced products such as nuclear fuels, specialty chemicals, energy materials, and semiconductor coatings increasingly rely on complex processes where chemical reactions and physical system behavior are tightly coupled. Existing system-level failure analysis tools are effective a…
- College: College of Engineering (COE)
- Inventors: Layer, Daniel; Diao, Xiaoxu; Smidts, Carol; Zanardo Rodrigues, Vinicius
- Licensing Officer: Giles, David
Dimension-Free Federated Learning for Large-Scale AI Models
TS-076904 —
Federated learning enables collaborative AI training without sharing sensitive data, making it attractive for healthcare, finance, edge computing, and enterprise applications. However, widespread deployment remains limited by the enormous communication burden associated with repeatedly transferrin…
- College: College of Engineering (COE)
- Inventors: Liu, Jia "Kevin"
- Licensing Officer: Giles, David
Label-Free Raman Imaging for Early Detection of Disease Remodeling
TS-076401 —
Many progressive diseases, including cardiac, neurological, and other chronic disorders, begin with subtle molecular and cellular changes long before conventional clinical signs become detectable. Current diagnostic approaches generally identify disease only after significant tissue remodeling or …
- College: College of Engineering (COE)
- Inventors: Veeraraghavan, Rengasayee; Ammon, Madison; Radwanski, Przemyslaw; Selimi, Zoja
- Licensing Officer: Ashouripashaki, Mandana
Automated Cross-Document Table Consolidation and Visualization Platform
TS-075489 —
Organizations across healthcare, government, finance, market intelligence, and regulatory sectors routinely generate large collections of reports containing valuable tabular data. While these reports often follow consistent formats, extracting, comparing, and analyzing information across multiple …
- College: College of Engineering (COE)
- Inventors: Bajaj, Goonmeet Kaur; Parthasarathy, Srinivasan
- Licensing Officer: Giles, David
Ontology-Based Fault Propagation Analysis for Safety-Critical Systems
TS-075450 —
Safety-critical systems in industries such as energy, aerospace, industrial automation, and advanced manufacturing are becoming increasingly complex, integrating hardware, software, controls, sensors, and communication networks. Existing fault analysis methods are often domain-specific and require…
- College: College of Engineering (COE)
- Inventors: Diao, Xiaoxu; Smidts, Carol
- Licensing Officer: Giles, David
EmitGCL: Prediction of Future Metastasis based on Graph Contrastive Learning
TS-075168 — Problem
Metastasis is the primary driver of cancer-related deaths, yet accurately predicting its onset is a major clinical challenge. Current diagnostic tools often fail to detect occult metastatic cells and metastatic precursor cells, resulting in either overdiagnosis, with unnecessary treatments,…
- College: College of Medicine (COM)
- Inventors: Ma, Qin; Wang, Xiaoying
- Licensing Officer: Hampton, Andrew
Ultra‑Fast 3D Real‑Time Cardiac MRI Without Gating or Binning
TS-074669 —
Current cardiac MRI workflows rely heavily on breath-holds, ECG gating, and retrospective binning, which break down in patients with arrhythmias, irregular breathing, or limited ability to cooperate. Existing 3D approaches often average away beat-to-beat variability or suffer from motion artifacts…
- College: College of Engineering (COE)
- Inventors: Ahmad, Rizwan; Arshad, Syed Murtaza; Chen, Chong; Sultan, Ahmad
- Licensing Officer: Randhawa, Davinder
Modular Generative AI Framework for Efficient Molecular Discovery
TS-074599 —
Discovering molecules that simultaneously satisfy multiple competing design criteria is a resource-intensive challenge across the pharmaceutical, energy, and materials industries. The enormity of chemical space makes exhaustive screening impractical, while existing AI-guided methods either restric…
- College: College of Engineering (COE)
- Inventors: Paulson, Joel; Muthyala, Madhav Reddy; Sorourifar, Farshud; Tan, Tianhong
- Licensing Officer: Randhawa, Davinder
DIAMOND: Risk-Based Cyber Vulnerability Management with Business Context Analytics
TS-074364 —
Senior executives struggle to understand and prioritize cybersecurity risk in business terms. Existing vulnerability scoring systems rely on opaque or arbitrary measures that fail to connect cybersecurity decisions to financial impact, staffing costs, or operational tradeoffs. As a result, organiz…
- College: College of Engineering (COE)
- Inventors: Allen, Theodore "Ted"; RoyChowdhury, Sayak
- Licensing Officer: Zinn, Ryan
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