Available Technologies
# of Displayed Technologies: 3 / 3
Applied Category Filter (Click To Remove): Semiconductors, Circuits, & Electronic Components
Methods to improve the jitter and time walk of integrated constant fraction discriminators
TS-064826 — The Need
Accurate measurements of energy and time-of-arrival of photons, particles, or ionizing radiation are crucial for identifying individual particles and enhancing spatial and temporal resolution in various systems. Technologies such as Light Detection and Ranging (LiDAR), positron emission to…
- College: College of Arts & Sciences
- Inventors: Kagan, Harris; Abusareya, Mo'men; Khalil, Waleed; Smith, Dale "Shane"
- Licensing Officer: Dahlman, Jason "Jay"
Scalable laser-assisted MOCVD chamber design with laser array input
TS-050244 — A design of scalable laser-assisted MOCVD chamber for III-nitrides and other semiconductors with a laser array input.
III-nitrides represent an important semiconductor material system for both optoelectronic and power electronic device applications. Advantages for III-nitrides include high electron saturation velocity, high critical electric field, high radiation resistance and decent thermal performance. Therefo…
- College: College of Engineering (COE)
- Inventors: Zhao, Hongping; Chen, Zhaoying
- Licensing Officer: Randhawa, Davinder
Capacitive Sensing Method for Integrated Circuit Identification and Authentication
TS-048641 — A method of authenticating an IC die’s origin and uniquely identifying each die with an intrinsic unclonable value through measurement of on-chip capacitance values
Hardware security in Integrated Circuit (IC) designs is of increasing importance in dealing with the insecure, expanding global supply chain of these parts. The ability to trace the origin of a die, combined with the capability to uniquely identify each die provides valuable quantitative measures …
- College: College of Engineering (COE)
- Inventors: Khalil, Waleed; Kines, Michael
- Licensing Officer: Ashouripashaki, Mandana
