Isolated Source Electrode Vertical Fin Field Effect Transistors (ISE-FinFET)The NeedNext‑generation power electronic systems require devices that deliver high breakdown voltage, large current handling, and fast switching while maintaining manufacturability at scale. Vertical FinFETs offer compelling performance advantages over incumbent bipolar and planar technologies, but their commercial adoption has been constrained by complex, alignment‑sensitive fabrication flows that increase cost, reduce yield, and limit scalability. There is a clear unmet need for a vertical FinFET architecture that preserves performance benefits while significantly simplifying manufacturing. The TechnologyOSU engineers have developed an Isolated Source Electrode vertical FinFET (ISE-finFET) architecture that incorporates a strategically placed non‑conductive region beneath a portion of the source electrode. This new design relaxes lithographic alignment requirements and eliminates multiple critical fabrication steps common to conventional vertical FinFETs. The result is a robust vertical transistor architecture that maintains full gate control and device performance while enabling a more manufacturing‑friendly process flow. Commercial Applications
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Tech IDT2025-060 CollegeLicensing ManagerAshouripashaki, Mandana InventorsCategoriesExternal Links |