Available Technologies
# of Displayed Technologies: 6 / 6
Applied Category Filter (Click To Remove): Instrumentation
Monolayer Etching of Wurtzite GaN/AlGaN/AlN Using Cyclic O2 Plasma and Atomic Ga/Al Flux Exposure
TS-063466 —
In the rapidly evolving world of semiconductor technology, there is a growing demand for efficient and precise methods of etching Gallium Nitride (GaN)-based semiconductors. Traditional wet and dry etching processes often damage the GaN, compromising the quality and performance of the final produc…
- College: College of Engineering (COE)
- Inventors: Rajan, Siddharth; Dheenan, Ashok; Rahman, Sheikh Ifatur; Wriedt, Nathan
- Licensing Officer: Zinn, Ryan
Wind speed and direction measurement system
TS-063362 — Introducing our Low-Drag Smart Tether System—the future of fluid speed and direction measurement. Experience unmatched accuracy, energy efficiency, and reliability, revolutionizing how we perceive and utilize wind data in the modern age.
In the realm of aerial technology, the demand for accurate, low-cost wind monitors that are both scalable and efficient has never been higher. Traditional methods, such as pitot tubes and cup-and-vane anemometers, are marred by issues like icing vulnerability, high energy consumption, and unsuitab…
- College: College of Engineering (COE)
- Inventors: Dapino, Marcelo; Headings, Leon
- Licensing Officer: Zinn, Ryan
A vibration free, low temperature sample holder for side-entry transmission electron microscopes
TS-055118 — This invention is a vibration free and temperature adjustable sample holder for transmission electron microscopes, allowing improved imaging of beam-sensitive and temperature dependent specimens in the physical sciences.
Transmission electron microscopy (TEM) is used to capture fine detail of specimens less than 100 nm thick making it ideal for physical, chemical, and biological sciences. To generate an image of a physical science specimen, the sample must be cooled to cryogenic temperatures to halt atomic movemen…
- College: College of Engineering (COE)
- Inventors: Reifsnyder, Alexander; McComb, David
- Licensing Officer: Zinn, Ryan
Cantilever Design for Measurement of Multi-Physical Properties using Atomic Force Microscopy
TS-036987 — A robust solution that helps researchers increase image and signal accuracy of Atomic Force Microscopy.
Atomic Force Microscopy (AFM) was first used to characterize properties of a sample, including physical, material, electromechanical and chemical properties. For most of these multi-physical characterization schemes, an AFM tip scans over a sample while the tip is in contact with the surface. At t…
- College: College of Engineering (COE)
- Inventors: Cho, Han Na "Hanna"; Bergman, Lawrence A; Dharmasena, Sajith; Kim, Seok; Vakakis, Alexander F.
- Licensing Officer: Zinn, Ryan
System for Measuring Nitric Oxide in Breath Vapor
TS-030498 — A novel system that selectively detects nitric oxide and generates a voltage indicating the measured amount.
Nitric oxide plays an important role in the biological system of living organisms. Nitiric oxide has been shown to regulate and mediate numerous processes in the nervous, immune, and cardiovascular systems by transmitting signals throughout the body. It is used within the cardiovascular system to …
- College: College of Arts & Sciences
- Inventors: Dutta, Prabir; Mondal, Suvra
- Licensing Officer: Zinn, Ryan
An Ultra Precision Six-Axis Visual Servo Control System
TS-014929 — A real-time visual measurement of six-degree-of-freedom motion with nanometer precision.
Conventional microscopic visual feedback systems have limited out-of-plane measurement resolution in the micrometer range, and conventional interferometry systems are inherently not real-time sensors. When dealing with dimensions of sub-micrometer range, small pre-calibration errors, e.g. non-orth…
- College: College of Engineering (COE)
- Inventors: Menq, Chia-Hsiang; Kim, Jung
- Licensing Officer: Zinn, Ryan
